SR4 Series Spectrometers
High SNR and Thermal Wavelength Stability
Versatile and robust, SR4 spectrometers offer high SNR and thermal wavelength stability for applications including plasma monitoring and reflection measurements. The spectrometer is anchored by a CCD-array detector and low-noise electronics for accurate, reliable results.
SR4 Series
| Specifications | Wavelength Range | Resolution (FWHM) (configuration-dependent) | Grating Groove Density (lines/mm) | Grating Blaze Wavelength |
| UV-Vis options: | 190-410 nm | 0.42 nm – 3.36 nm | 1800 | Holographic |
| 190-535 nm | 0.58 nm – 4.62 nm | 1200 | Holographic | |
| 190-850 nm | 1.17 nm – 9.24 nm | 600 | 240 nm | |
| 190-910 nm | 1.17 nm – 9.24 nm | 600 | 300 nm | |
| 190-910 nm | 1.17 nm – 9.24 nm | 600 | 400 nm | |
| Vis-NIR options: | 350-1040 nm | 1.17 nm – 9.24 nm | 600 | 400 nm |
| 350-1040 nm | 1.17 nm – 9.24 nm | 600 | 500 nm | |
| NIR options: | 570-860 nm | 0.58 nm – 4.62 nm | 1200 | 750 nm |
| 600-1050 nm | 1.17 nm – 9.24 nm | 600 | 1000 nm | |
| Extended-range options: | 190-1050 nm | 1.43 nm – 11.34 nm | 500 | 250 nm |
| Slit Options | 5, 10, 25, 50, 100, 200 µm | |||
| Integration Time | 3.8ms-10s | |||
| SNR (single scan @ 10 ms) | 250:1 | |||
| SNR (max. per second w/High Speed Averaging Mode): | 3000:1 | |||
| Connectors | USB Type-C, SMA, 16 pin Samtec TFM, RS-232 | |||
| Physical Dimensions | 88.1 x 63.5 x 31.45 mm | |||
| Weight | 275 g | |||
| Temperature (operation) | 0 °C – 55 °C | |||
| Temperature (storage) | -30 °C to 70 °C | |||