Ocean Optics offers specular and diffuse reflectance standards for measurements of various types of sample surfaces. Reflectance measurements are a ratio of the reflected light spectrum to the incident light spectrum. Since there is no way to directly collect all of the light incident on a surface, reflectivity is usually measured relative to a reference standard. To ensure best results, the standard selected should be similar in reflectivity to the sample to be measured.
|Item||Type||Reflectance Material||Key Feature|
|STAN-SSH||Specular||Al mirror on fused silica substrate||High reflectivity standard|
|STAN-SSH-NIST||Specular||Al mirror on fused silica substrate||NIST-traceable standard|
|STAN-SSL||Specular||Schott ND9 glass||Low reflectivity standard|
|STAN-HOLDER||Accessory||NA||Protects STAN-SSH units|
|WS-1||Diffuse||PTFE||>98% reflective from 250-1500 nm|
|WS-1-SL||Diffuse||Spectralon||>99% reflective from 400-1500 nm|
Additional Spectralon reflectance standards and targets are also available. Please contact an Applications Sales Engineer for assistance.