STAN Series Reflectance Standards

Prices may vary, see options below

Availability:
View Product Models
Item Type Reflectance Material Wavelength Range
STAN-SSH High reflectivity Al mirror on fused silica substrate 250-2500 nm
STAN-SSH-NIST High reflectivity Al mirror on fused silica substrate 250-2500 nm
STAN-SSL Low reflectivity Schott ND9 glass 200-2500 nm
STAN-HOLDER Accessory NA NA
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Ideal for Specular Reflectance Measurements

Ocean Optics offers specular reflectance standards for measuring shiny surfaces such as machined metals and semiconductor materials and low-reflectivity surfaces such as anti-reflective coatings and thin film coatings.

The STAN-SSH varies in reflectivity from 85%-98% over the 250-2500 nm wavelength range and is available in a version (STAN-SSH-NIST) calibrated to a NIST master standard. The NIST calibration data range is 250-2500 nm.

For measuring surfaces with low specular reflectivity, we recommend the STAN-SSL, which has ~4% reflectivity from 200-2500 nm. Add a STAN-HOLDER to keep your standards in place and to protect their coatings.

  • Specular reflectance – options for high and low specular reflectivity
  • Calibrated standard – NIST-traceable version available
  • Convenient holder – optional accessory holds standard in place

Engineering Specifications STAN-SSH STAN-SSH-NIST STAN-SSL
Dimensions (substrate): 31.75 mm OD x 6.35 mm height 31.75 mm OD x 6.35 mm height 31.75 mm OD x 6.35 mm height
Dimensions (housing): 38 mm OD x 19 mm height 38 mm OD x 19 mm height 38 mm OD x 19 mm height
Weight: 40 g 40 g 40 g
Reflectance material: Al mirror on fused silica substrate Al mirror on fused silica substrate Schott ND9 glass
Reflectivity: ~85%-90% (250-800 nm) ~85%-90% (250-800 nm) ~5% (200-950 nm)
~85%-98% (800-2500 nm) ~85%-98% (800-2500 nm) ~4% (950-2500 nm)

Measurement Techniques in which this product is used:

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