STS-VIS

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Vis Spectral Analysis in a Tiny Footprint

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SKU: STS-VIS

The STS-VIS spectrometer delivers the performance you need, whether you are performing low-concentration absorbance measurements or high intensity laser characterization. It covers the range of 350-800 nm. Its rugged design and great unit-to-unit reproducibility make STS attractive for integration into devices or applications where a small footprint is required.

  • Compact – actual size is 40 x 42 x 24 mm
  • Powerful – high signal-to-noise (>1500:1) and dynamic range (4600:1) performance
  • Thermally stable – peak shape stays the same over a wide temperature range
  • Cost-effective – optical resolution of 1.5 nm is comparable to benchtop spectrometers
  • Reproducible – attractive design for OEM manufacturers
  • Plug-and-play – easy connectivity and adaptability with other devices

Engineering Specifications STS-VIS
Dimensions: 40 mm x 42 mm x 24 mm
Weight: ~ 60 g
Detector: ELIS1024
Wavelength range: 350-800 nm
Integration time: 10 µs – 10 s
Dynamic range: 5 x 109 (system, 10 s max integration), ~4600 single acquisition
Signal-to-noise ratio: >1500:1 (maximum signal)
Dark noise: ≤3 counts rms
Grating: 600 g/mm
Slit: 10, 25, 50, 100 or 200 µm
Detector collection lens: no
Order-sorting: no
Optical resolution:
  • 1.0 nm (10 µm slit)
  • 1.5 nm (25 µm slit)
  • 3.0 nm (50 µm slit)
  • 6.0 nm (100 µm slit)
  • 12.0 nm (200 µm slit)
Stray light: ≤0.25% at 590 nm
Fiber optic connector: SMA 905

Measurement Techniques in which this product is used:

The relative response of STS model spectrometers shows the relationship between grating efficiency and wavelength range. Our setups used each spectrometer with a deuterium-tungsten halogen source and 600 µm SR fiber. The data was taken in Scope Mode (raw data) and normalized.